- All submissions should be written in English with draft papers up to six (6) printed pages in length, two-column, single-spaced with 10-point font on US Letter paper.
- Final papers that exceed six (6) pages will be assessed a per-page over-length charge of US$150/page, up to a maximum of eight (8) total pages. View the Manuscript Templates for Conference Proceedings page for Microsoft Word and LaTeX formatted templates that follow the guidelines for ComSoc publications.
- EDAS requires an abstract to get underway. The MILCOM Technical Team suggests using the same abstract that your draft paper will have (required by the template).
- A draft paper must be submitted for consideration prior to the final closing dates on www.milcom.org under the “Call for Papers”. The abstract length generally runs from 200-500 words as a general rule (the template has an example).
- The papers follow IEEE policy and will have at least three qualified blind reviewers and will be judged against other submitted papers for applicability, etc.
- To be published in the IEEE MILCOM 2023 Conference Proceedings and to be eligible for publication in IEEE Xplore®, an author of an accepted paper is required to register for the conference at a full conference rate and the paper must be presented by an author of that paper at the conference.
- Non-refundable registration fees must be paid prior to uploading the final IEEE formatted, publication-ready version of the paper. (For authors with multiple accepted papers, one full registration is valid for up to 3 papers.)
- Accepted and presented papers will be published in the IEEE MILCOM 2023 Conference Proceedings and submitted to IEEE Xplore® as well as other Abstracting and Indexing (A&I) databases.
- For final manuscript preparation, papers must first be made compatible with IEEE Xplore using PDF express.
Papers are reviewed on the basis that they do not contain plagiarized material and have not been submitted to any other conference at the same time (double submission). These matters are taken very seriously and IEEE will take action against any author who has engaged in either practice.